Remenyuk, A.D., Zvonareva, T.K., Serenkov, I.T., Sakharov, V.I., Perova, T.S., Wasyluk, J., Ruserford Back-scattering and Micro-Raman spectroscopy of composite a-C:Pt films grown by magnetron co-sputtering of graphite and Pt targets by photoelectrochemical etching of silicon, Semiconductors, 44, 8, 2010, 1074-1079
Semiconductors; 44; 8;
Raman spectra have been measured in the spectral range from 1000 to 1800 cm−1 on samples of amorphous carbon modified with platinum in amounts comparable with that of carbon. Also, Rutherford backscattering spectra have been studied. It is shown that, as the platinum concentration is raised to ∼0.5 × 1022 at cm−3, the average size of graphene clusters increases. As the platinum concentration increases further, the graphene clusters become smaller in size.
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