Please use this identifier to cite or link to this item:
http://hdl.handle.net/2262/61764
Title:
Ruserford Back-scattering and Micro-Raman spectroscopy of composite a-C:Pt films grown by magnetron co-sputtering of graphite and Pt targets by photoelectrochemical etching of silicon
Remenyuk, A.D., Zvonareva, T.K., Serenkov, I.T., Sakharov, V.I., Perova, T.S., Wasyluk, J., Ruserford Back-scattering and Micro-Raman spectroscopy of composite a-C:Pt films grown by magnetron co-sputtering of graphite and Pt targets by photoelectrochemical etching of silicon, Semiconductors, 44, 8, 2010, 1074-1079
Series/Report no.:
Semiconductors; 44; 8;
Abstract:
Raman spectra have been measured in the spectral range from 1000 to 1800 cm−1 on samples of amorphous carbon modified with platinum in amounts comparable with that of carbon. Also, Rutherford backscattering spectra have been studied. It is shown that, as the platinum concentration is raised to ∼0.5 × 1022 at cm−3, the average size of graphene clusters increases. As the platinum concentration increases further, the graphene clusters become smaller in size.
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