Osing, J., Shvets, I.V., Bulk defects in graphite observed with a scanning tunnelling microscope , Surface Science, 417, 1, 1998, 145-150
Series/Report no.:
Surface Science; 417; 1;
Abstract:
Scanning tunnelling microscopy (STM) has been used to observe a misorientation of a graphite layer that is buried several layers below the surface. A nanoscale periodic pattern superimposed on the atomic graphite lattice has been observed. The appearance of the superperiodic features in the STM image is shown to be clearly tip-sample distance dependent. We suggest that a subsurface misorientation, several layers deep, causes a nanoscale moire pattern, which can propagate to the surface and contributes to the STM image. This result is rather surprising as STM is thought to be unable to image bulk defects.
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