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Please use this identifier to cite or link to this item: http://hdl.handle.net/2262/49124

Title: Selecting the tip electron orbital for scanning tunneling microscopy imaging with sub-ångström lateral resolution
Author: SHVETS, IGOR
BOZHKO, SERGEY
KRASNIKOV, SERGEY
LUBBEN, OLAF
Author's Homepage: http://people.tcd.ie/ivchvets
http://people.tcd.ie/bozhkos
http://people.tcd.ie/krasniks
Keywords: Particles and fields physics
sub-ångström
Issue Date: 2010
Publisher: Institute of Physics
Citation: A. N. Chaika, S. S. Nazin, V. N. Semenov, S. I. Bozhko, O. Lübben, S. A. Krasnikov, K. Radican and I. V. Shvets, Selecting the tip electron orbital for scanning tunneling microscopy imaging with sub-ångström lateral resolution, EPL (Europhysics Letters), 92, 4, 2010, 6
Series/Report no.: EPL (Europhysics Letters);
92;
4;
Abstract: We report on scanning tunneling microscopy (STM) studies performed with single crystalline W[001] tips on a graphite(0001) surface. Results of distance-dependent STM experiments with sub-ångström lateral resolution and density functional theory electronic structure calculations show how to controllably select one of the tip electron orbitals for high-resolution STM imaging. This is confirmed by experimental images reproducing the shape of the 5dxz,yz and 5dx2 − y2 tungsten atomic orbitals. The presented data demonstrate that the application of oriented single crystalline probes can provide further control of spatial resolution and expand the capabilities of STM.
Description: PUBLISHED
URI: http://hdl.handle.net/2262/49124
Related links: http://dx.doi.org/10.1209/0295-5075/92/46003
Appears in Collections:Physics (Scholarly Publications)

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