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Please use this identifier to cite or link to this item: http://hdl.handle.net/2262/49108

Title: An improved technique for the measurement of the complex susceptibility of magnetic colloids in the microwave region
Author: FANNIN, PAUL
COUPER, COLIN STUART
Author's Homepage: http://people.tcd.ie/couperc
http://people.tcd.ie/pfannin
http://people.tcd.ie/couperc
Keywords: Electrical and electronic engineering
Ferromagnetic resonance
Issue Date: 2010
Publisher: Elsevier
Citation: P.C. Fannin, C. MacOireachtaigh and C. Couper, An improved technique for the measurement of the complex susceptibility of magnetic colloids in the microwave region, Journal of Magnetism and Magnetic Materials, 322, 16, 2010, 2428-2433
Series/Report no.: Journal of Magnetism and Magnetic Materials;
322;
16;
Abstract: Measurements by means of the short-circuit (S/C) and open circuit (O/C) transmission line techniques are well established methods for investigating the magnetic and dielectric properties of magnetic colloids, respectively. In particular, the S/C technique has been used in the investigation of the resonant properties of ferrofluids; resonance being indicated by the transition of the real component of the magnetic complex susceptibility, χ(ω)=χ′(ω)−iχ″(ω), from a positive to a negative value at a frequency, fres. However, under certain circumstances, the accuracy of the S/C technique is affected by the dielectric properties of the sample, hence incurring errors in the measurement of χ(ω) and indeed of fres. Here we present a model which, by combining short-circuit and open circuit measurements, is developed in a manner in which the permeability, μ, and the permittivity, ε, contribute simultaneously to the calculation of χ(ω), thereby providing superior experimental results in comparison to those obtained by the S/C technique alone. For the two ferrofluid samples measured it is demonstrated that the dielectric properties affect the high frequency content of the susceptibility spectrum.
Description: PUBLISHED
URI: http://hdl.handle.net/2262/49108
Related links: http://dx.doi.org/10.1016/j.jmmm.2010.02.051
Appears in Collections:Electronic & Electrical Eng (Scholarly Publications)

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