Koblischka-Veneva, A,; Koblischka, M. R.; Wei, J. D.; Zhou, Y.; Murphy, S.; Mucklich, F.; Hartmann, U.; Shvets, I. V., Misorientations in  magnetite thin films studied by electron backscatter diffraction and magnetic force microscopy, Journal of Applied Physics, PROCEEDINGS OF THE TENTH JOINT MMM/INTERMAG CONFERENCE, Baltimore Maryland, 7-11 January, 2007, 101, 9, AMERICAN INSTITUTE OF PHYSICS, 2007, 09M507
Magnetite thin films grown on 001 oriented MgO substrates are analyzed by means of electron
backscatter diffraction EBSD analysis and magnetic force microscopy in applied fields. The EBSD
technique enables the crystallographic orientation of individual grains to be determined with a high
spatial resolution up to 20 nm on such ceramic samples. A high image quality of the recorded
Kikuchi patterns was achieved enabling multiphase scans and high spatial resolution measurements.
Upon annealing in air, the magnetic properties of the magnetite thin films were found to change
considerably. Using the EBSD analysis, we find that misoriented grains remaining after the
annealing step form small islands with a size of about 100 nm. The size and distribution of these
islands correspond well to the observations of antiferromagnetic pinning centers within the magnetic
domain structures carried out by magnetic force microscopy on the same samples.
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