A. Koblischka-Venevaa, M. R. Koblischka, S. Murphy and S. K. Arora, F. Mücklich, U. Hartmann and I. V. Shvets, Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction, Journal of Applied Physics, 52nd Annual Conference on Magnetism and Magnetic Materials, Tampa, Florida, USA, 05-09 November 2007, Koblischka-Veneva, A.; Koglischka, M. R.; Murphy, S.; Arora, S. K.; Mucklich, F.; Hartmann, U.; Shvets, I. V., 103, 7, AIP, 2008, 07E505
Series/Report no.:
103; 7;
Abstract:
The grain orientation of (001)- and (111)-oriented magnetite thin films grown on MgO substrates (film thickness of 100–400 nm) is analyzed by means of the electron-backscatter diffraction (EBSD) technique. The (001) surface after a short annealing in air (1 min, 250 °C) is characterized by the presence of tiny (diameter of 100–200 nm) misoriented islands, which have an influence on the antiferromagnetic coupling within the film. In the (111)-oriented films, such defects are found to be absent, and the films show a very homogeneous surface. The achieved spatial resolution enables further a cross-section analysis of a 400-nm-thick film with (001) orientation, even close to the interface MgO-magnetite.
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