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Please use this identifier to cite or link to this item: http://hdl.handle.net/2262/40322

Title: Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction
Author: MURPHY, SHANE
ARORA, SUNIL KUMAR
SHVETS, IGOR
Sponsor: European Union (EU)
Author's Homepage: http://people.tcd.ie/ivchvets
http://people.tcd.ie/shmurphy
http://people.tcd.ie/aroras
Keywords: Atomic, molecular and chemical physics
thin films
Issue Date: 2008
Publisher: American Institute of Physics
Citation: A. Koblischka-Venevaa, M. R. Koblischka, S. Murphy and S. K. Arora, F. Mücklich, U. Hartmann and I. V. Shvets, Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction, Journal of Applied Physics, 52nd Annual Conference on Magnetism and Magnetic Materials, Tampa, Florida, USA, 05-09 November 2007, Koblischka-Veneva, A.; Koglischka, M. R.; Murphy, S.; Arora, S. K.; Mucklich, F.; Hartmann, U.; Shvets, I. V., 103, 7, AIP, 2008, 07E505
Series/Report no.: 103;
7;
Abstract: The grain orientation of (001)- and (111)-oriented magnetite thin films grown on MgO substrates (film thickness of 100–400 nm) is analyzed by means of the electron-backscatter diffraction (EBSD) technique. The (001) surface after a short annealing in air (1 min, 250 °C) is characterized by the presence of tiny (diameter of 100–200 nm) misoriented islands, which have an influence on the antiferromagnetic coupling within the film. In the (111)-oriented films, such defects are found to be absent, and the films show a very homogeneous surface. The achieved spatial resolution enables further a cross-section analysis of a 400-nm-thick film with (001) orientation, even close to the interface MgO-magnetite.
Description: PUBLISHED
URI: http://hdl.handle.net/2262/40322
Related links: http://dx.doi.org/10.1063/1.2837283
Appears in Collections:Physics (Scholarly Publications)

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