All-optical sampling based on two-photon absorption in a semiconductor microcavity for high-speed OTDM, Proceedings of SPIE, Opto-Ireland 2005: Optoelectronics, Photonic Devices, and Optical Networks , Dublin, Ireland , 4th April, edited by John G. McInerney, Gerard Farrell, David M. Denieffe, Liam P. Barry, Harold S. Gamble, Padraig J. Hughes, Alan Moore , 5825, SPIE, 2005, pp316-325
Future high-speed optical communications networks operating at data rates in excess of 100Gbit/s per channel
will require a sensitive and ultrafast technique for precise optical signal monitoring.1 The standard way of
characterising high-speed optical signals to use a fast photodetector in conjunction with a high-speed oscilloscope.
However, this method is limited to a maximum data rate of approximately 40Gbit/s. An alternative is to employ
all-optical sampling techniques based on ultrafast optical nonlinearities present in optical fibres, optical crystals
and semiconductors. One such nonlinearity is the optical-to-electrical process of Two-Photon Absorption (TPA)
in a semiconductor. This paper presents an optical sampling technique based on TPA in a specially designed
semiconductor microcavity. By incorporating the microcavity design, we are able to enhance the TPA efficiency
to a level that can be used for high-speed optical sampling.
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