TARA: Rapid Thermal Oxidation of Strained-Ge Layers

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Please use this identifier to cite or link to this item: http://hdl.handle.net/2262/36649

Title:	Rapid Thermal Oxidation of Strained-Ge Layers
Other Titles:	IEEE 24th International Conference on Microelectronics (MIEL-2004)
Author:	MOORE, ALAN PEROVA, TANIA
Author's Homepage:	http://people.tcd.ie/rmoore http://people.tcd.ie/perovat
Keywords:	Electronic & Electrical Engineering
Issue Date:	2004
Citation:	S. Das, S. Chakraborty, S. Bhattacharya, M. Bain, J. McCarthy, B.M. Armstrong, H.S. Gamble, G.K. Dalapati, S.K. Samanta, T. Perova, R.A. Moore and C.K. Maiti, Rapid Thermal Oxidation of Strained-Ge Layers, IEEE 24th International Conference on Microelectronics (MIEL-2004), NIS, Serbia and Montenegro, 16-19 May, 24, 2, 2004, 479, 482
Series/Report no.:	24 2
Description:	PRESENTED NIS, Serbia and Montenegro Oral Presentation.
URI:	http://hdl.handle.net/2262/36649
Related links:	http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=01314867
Appears in Collections:	Electronic & Electrical Eng (Scholarly Publications)

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