Form birefringence of oxidized porous silicon
Citation:
L.A. Golovan, D.A. Ivanov, V.A. Melnikov, V.Yu. Timoshenko, A.M. Zheltikov, P.K. Kashkarov, G.I. Petrov, V.V. Yakovlev `Form birefringence of oxidized porous silicon? in Applied Physics Letters, 88, 2006, pp 241113/1 - 241113/3Download Item:
ApplPhysLett_88_241113.pdf (published (publisher copy) peer-reviewed) 115.0Kb
Abstract:
A network of preferentially oriented pores is shown to induce anisotropy of linear and nonlinear optical properties of oxidized porous silicon (OPS) films. Although the x-ray diffraction indicates the presence of amorphous phase in OPS samples, the near-infrared and visible transmission measurements reveal a strong in-plane anisotropy exceeding that for the crystalline quartz. This anisotropy modifies dramatically polarization properties of the nonlinear optical properties resulting in a strong anisotropy of the third-harmonic signal generated from these films
Author's Homepage:
http://people.tcd.ie/melnikovDescription:
PUBLISHED
Author: MELNIKOV, VASILY
Publisher:
American Institute of PhysicsType of material:
Journal ArticleSeries/Report no:
Applied Physics Letters88
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Full text availableKeywords:
Electronic & Electrical EngineeringISSN:
0003-6951Licences: