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Title: Automatic location of IC design errors using an e-beam system
Other Titles: International Test Conference: 1988
Author's Homepage:
Keywords: E-beam tester
ADVICE system
VLSI devices
Issue Date: 1988
Publisher: IEEE
Citation: Melgara, M., Battu, M., Garino, P., Dowe, J., Vernay, Y.J., Marzouki, M., Boland, F., Automatic location of IC design errors using an e-beam system, [in] digest of papers - International Test Conference , Washington, DC, : IEEE, 1988, pp898-907
Abstract: The ADVICE system discussed is an enhanced CAD (computer-aided design) linked E-beam tester to locate automatically design errors on custom VLSI devices. The goal is met by building a set of procedures to drive the interactive electron-beam debugging (EBD) system according to the strategies devised by the algorithms based on fault dictionary/hierarchical probing algorithm mixed search
Description: PUBLISHED
Appears in Collections:Electronic & Electrical Eng (Scholarly Publications)

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