TARA: Automatic location of IC design errors using an e-beam system

Home

Submit

Alerts

Academic/Research Units
& Collections

Title

Author

By Date of Publication

Subject

Sponsors

TARA >
School of Engineering >
Electronic & Electrical Eng >
Electronic & Electrical Eng (Scholarly Publications) >

Please use this identifier to cite or link to this item: http://hdl.handle.net/2262/19679

Title:	Automatic location of IC design errors using an e-beam system
Other Titles:	International Test Conference: 1988
Author:	BOLAND, FRANCIS MORGAN
Author's Homepage:	http://people.tcd.ie/fboland
Keywords:	E-beam tester ADVICE system VLSI devices
Issue Date:	1988
Publisher:	IEEE
Citation:	Melgara, M., Battu, M., Garino, P., Dowe, J., Vernay, Y.J., Marzouki, M., Boland, F., Automatic location of IC design errors using an e-beam system, [in] digest of papers - International Test Conference , Washington, DC, : IEEE, 1988, pp898-907
Abstract:	The ADVICE system discussed is an enhanced CAD (computer-aided design) linked E-beam tester to locate automatically design errors on custom VLSI devices. The goal is met by building a set of procedures to drive the interactive electron-beam debugging (EBD) system according to the strategies devised by the algorithms based on fault dictionary/hierarchical probing algorithm mixed search
Description:	PUBLISHED
URI:	http://ieeexplore.ieee.org/iel2/213/5318/00207878.pdf?tp=&isnumber=&arnumber=207878 http://hdl.handle.net/2262/19679
Appears in Collections:	Electronic & Electrical Eng (Scholarly Publications)

Files in This Item:

File	Description	Size	Format
Boland.pdf	publisher pdf	757.05 kB	Adobe PDF	View/Open

This item is protected by original copyright

View License

Please note: There is a known bug in some browsers that causes an error when a user tries to view large pdf file within the browser window. If you receive the message "The file is damaged and could not be repaired", please try one of the solutions linked below based on the browser you are using.