Investigations of nano-scale helical pitch in SmCá* and SmC* phases of a chiral smectic liquid crystal using differential optical reflectivity measurements
Citation:
V. P. Panov, B. K. McCoy, Z. Q. Liu, J. K. Vij, J. W. Goodby and C. C. Huang, Investigations of nano-scale helical pitch in SmCá* and SmC* phases of a chiral smectic liquid crystal using differential optical reflectivity measurements, Physical Review E, 74, 2006, 011701-1 - 011701-7Download Item:
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Abstract:
Differential optical reflectivity (DOR) was used to study the temperature dependence of the short helical pitch in freestanding films of a liquid crystal compound. The experimentally measured DOR signal was fitted using Berreman's 4?4 matrix method to get the pitch value in the smectic-C (SmC) phase. The results show continuous evolution of the pitch between the smectic-C* and SmC phases. In SmC, the pitch decreases as temperature increases and is found to level off at 16?1 smectic layers at the SmC to smectic-A* transition.
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Science Foundation Ireland (SFI)
Author's Homepage:
http://people.tcd.ie/jvijhttp://people.tcd.ie/vpanov
Description:
PUBLISHED(also reprinted in Virtual Journal of Nanoscale Science and Technology)
Author: VIJ, JAGDISH; PANOV, VITALI
Type of material:
Journal ArticleSeries/Report no:
Physical Review E74
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Electronic & Electrical EngineeringDOI:
http://dx.doi.org/10.1103/PhysRevE.74.011701Licences: