Maguire, P.J. and Barry, L.P. and Krug, T. and Dowd, J.O. and Lynch, M. and Bradley, A.L. and Donegan, J.F. and Folliot, H. 'Direct measurement of a high-speed (>100Gbit/s) OTDM data signal utilising two-photon absorption in a semiconductor microcavity' in proceedings of the 18th Annual Meeting of the IEEE Lasers and Electro-Optics Society (LEOS 2005), 2005, pp. 142 – 143.
The future development of high-speed optical data channels, operating at individual data rates in excess of 100Gbit/s, will require a sensitive and ultra-fast method for pulse measurement . Current high-speed signals are usually characterized using a fast photodetector in conjunction with a high-speed oscilloscope, but are limited to maximum data rate of approximately 40Gbit/s. An alternative is to employ all-optical sampling techniques based on ultra-fast optical nonlinearities present in optical fibres, crystals and semiconductors. One such nonlinearity is the optical-to-electrical process of Two-Photon Absorption (TPA) in a semiconductor .
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