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Please use this identifier to cite or link to this item: http://hdl.handle.net/2262/15559

Title: Automated Segmentation of Torn Frames using the Graph Cuts Technique
Other Titles: Image Processing
IEEE International Conference on Image Processing, 2007. ICIP 2007.
Author: CORRIGAN, DAVID
HARTE, NAOMI
KOKARAM, ANIL CHRISTOPHER
Sponsor: Irish Research Council for Science Engineering and Technology
Author's Homepage: http://people.tcd.ie/akokaram
http://people.tcd.ie/dacorrig
http://people.tcd.ie/nharte
Keywords: Electronic & Electrical Engineering
Issue Date: 2007
Citation: Corrigan, David; Harte, Naomi; Kokaram, Anil;, Automated Segmentation of Torn Frames using the Graph Cuts Technique, Image Processing, IEEE International Conference on Image Processing, 2007. ICIP 2007., San Antonio, TX, USA, 2007, Sept. 16-Oct. 19, 2007, 557-560
Series/Report no.: Sept. 16-Oct. 19
Abstract: Film Tear is a form of degradation in archived film and is the physical ripping of the film material. Tear causes displacement of a region of the degraded frame and the loss of image data along the boundary of tear. In [1], a restoration algorithm was proposed to correct the displacement in the frame introduced by the tear by estimating the global motion of the 2 regions either side of the tear. However, the algorithm depended on a user-defined segmentation to divide the frame. This paper presents a new fully-automated segmentation algorithm which divides affected frames along the tear. The algorithm employs the graph cuts optimisation technique and uses temporal intensity differences, rather than spatial gradient, to describe the boundary properties of the segmentation. Segmentations produced with the proposed algorithm agree well with the perceived correct segmentation.
Description: PUBLISHED
San Antonio, TX, USA
URI: http://ieeexplore.ieee.org/iel5/4378863/4378864/04379015.pdf?tp=&isnumber=4378864&arnumber=4379015&punumber=4378863
http://ieeexplore.ieee.org/iel5/4378863/4378864/04379015.pdf?tp=&isnumber=4378864&arnumber=4379015&punumber=4378863
http://hdl.handle.net/2262/15559
Related links: http://ieeexplore.ieee.org/iel5/4378863/4378864/04379015.pdf?tp=&isnumber=4378864&arnumber=4379015&punumber=4378863
Appears in Collections:Electronic & Electrical Eng (Scholarly Publications)

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