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dc.contributor.authorJones, Lewys
dc.date.accessioned2022-03-07T13:52:15Z
dc.date.available2022-03-07T13:52:15Z
dc.date.issued2021
dc.date.submitted2021en
dc.identifier.citationQuigley, Frances and McBean, Patrick and O'Donovan, Peter and Jones, Lewys, Cost & Capability Compromises in STEM Instrumentation for Low-Voltage Imaging, arXiv preprint arXiv:2108.12356, 2021en
dc.identifier.otherY
dc.identifier.urihttp://hdl.handle.net/2262/98238
dc.descriptionPUBLISHEDen
dc.description.abstractWhen characterising beam-sensitive materials in the scanning transmission electron microscope (STEM), low- dose techniques are essential for the reliable observation of samples in their true state. A simple route to minimise both the total electron-dose and the dose-rate is to reduce the electron beam-current and/or raster the probe at higher speeds. At the limit of these settings, and with current detectors, the resulting images suffer from unacceptable artefacts including; signal-streaking, detector-afterglow, and poor signal-to-noise ratios (SNR). In this manuscript we present an alternative approach to capture dark-field STEM images by pulse- counting individual electrons as they are scattered to the annular dark-field (ADF) detector. Digital images formed in this way are immune from analogue artefacts of streaking or afterglow and allow clean, high-SNR images to be obtained even at low beam-currents. We present results from both a ThermoFisher FEI Titan G2 operated at 300kV and a Nion UltraSTEM200 operated at 200kV, and compare the images to conventional analogue recordings. ADF data are compared with analogue counterparts for each instrument, a digital detector-response scan is performed on the Titan, and the overall rastering efficiency is evaluated for various scanning parametersen
dc.language.isoenen
dc.relation.ispartofseriesarXiv preprint arXiv:2108.12356;
dc.rightsYen
dc.subjectThermoFisher FEI Titan G2en
dc.subjectbeam-sensitive materialsen
dc.subjectDigital imagesen
dc.subjectImage simulationen
dc.subjectChromatic aberrationen
dc.subjectLow- voltage imagingen
dc.subjectMonochromationen
dc.subjectScanning transmission electron microscope (STEM)en
dc.titleCost & Capability Compromises in STEM Instrumentation for Low-Voltage Imagingen
dc.typeJournal Articleen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/jonesl1
dc.identifier.rssinternalid236997
dc.identifier.doihttps://arxiv.org/abs/2108.12356
dc.rights.ecaccessrightsopenAccess
dc.contributor.sponsorGrantNumberURF/RI/191637en
dc.identifier.orcid_id0000-0002-6907-0731


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