Prospect for detecting magnetism of a single impurity atom using electron magnetic chiral dichroism
Citation:
Negi, Devendra and Zeiger, Paul M and Jones, Lewys and Idrobo, Juan-Carlos and van Aken, Peter A and Rusz, J{\'a, Prospect for detecting magnetism of a single impurity atom using electron magnetic chiral dichroism, Physical Review B, 100, 10, 2019, 104434Download Item:
PhysRevB.100.104434.pdf (PDF) 2.155Mb
Abstract:
Dopants, even single atoms, can influence the electrical and magnetic properties of materials. Here we demonstrate the opportunity for detecting the magnetic response of an embedded magnetic impurity in a nonmagnetic host material. We combine a depth sectioning approach with electron magnetic circular dichroism in scanning transmission electron microscopy to compute the depth-resolved magnetic inelastic-scattering cross section of single Co impurity buried in the host crystal of GaAs. Our calculations suggest that the magnetic dichroic signal intensity is sensitive to the depth and lateral position of the electron probe relative to the magnetic impurity. Additionally, a more precise dichroic signal localization can be achieved via choosing higher-collection-angle (β) apertures. Quantitative evaluation of the inelastic-scattering cross section and signal-to-noise ratio indicates that the magnetic signal from a single Co atom is on the verge of being detectable with today's state-of-the-art instrumentation.
URI:
https://journals.aps.org/prb/abstract/10.1103/PhysRevB.100.104434http://hdl.handle.net/2262/95296
Author's Homepage:
http://people.tcd.ie/jonesl1Description:
PUBLISHED
Author: Jones, Lewys
Publisher:
American Physical SocietyType of material:
Journal ArticleURI:
https://journals.aps.org/prb/abstract/10.1103/PhysRevB.100.104434http://hdl.handle.net/2262/95296
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Series/Report no:
Physical Review B;100;
10;
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Full text availableKeywords:
Electron energy loss spectroscopy, Electron magnetic circular dichroism, Scanning transmission electron microscopy, Magnetization measurements, Condensed Matter & Materials PhysicsDOI:
https://doi.org/10.1103/PhysRevB.100.104434Licences: