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dc.contributor.authorMAGUIRE, CIARAN
dc.contributor.authorSillence, Katherine
dc.contributor.authorRoesslein, Matthias
dc.contributor.authorHannell, Claire
dc.contributor.authorSuarez, Guillaume
dc.contributor.authorSauvain, Jean-Jacques
dc.contributor.authorCapracotta, Sonja
dc.contributor.authorContal, Servane
dc.contributor.authorCambier, Sebastien
dc.contributor.authorEl Yamani, Naouale
dc.contributor.authorDusinska, Maria
dc.contributor.authorDybowska, Agnieszka
dc.contributor.authorVennemann, Antje
dc.contributor.authorCooke, Laura
dc.contributor.authorHaase, Andrea
dc.contributor.authorLuch, Andreas
dc.contributor.authorWiemann, Martin
dc.contributor.authorGutleb, Arno
dc.contributor.authorKorenstein, Rafi
dc.contributor.authorRiediker, Michael
dc.contributor.authorWick, Peter
dc.contributor.authorHole, Patrick
dc.contributor.authorPrina-Mello, Adriele
dc.date.accessioned2020-03-19T11:36:04Z
dc.date.available2020-03-19T11:36:04Z
dc.date.issued2017
dc.date.submitted2017en
dc.identifier.citationMaguire, C.M., Sillence, K., Roesslein, M., Hannell, C., Suarez, C., Sauvain, J.-J., Capracotta, S., Contal, S., Cambier, S., El Yamani, N., Dusinska, M., Dybowska, A., Vennemann, A., Cooke, L., Haase, A., Luch, A., Wiemann, M., Gutleb, A., Korenstein, R., Riediker, M., Wick, P., Hole, P. & Prina-Mello, A., Benchmark of Nanoparticle Tracking Analysis on Measuring Nanoparticle Sizing and Concentration, Journal of Micro and Nano-Manufacturing, 5, 4, 2017, 041002-1 - 041002-10en
dc.identifier.otherY
dc.identifier.urihttps://asmedigitalcollection.asme.org/micronanomanufacturing/article-abstract/5/4/041002/369702/Benchmark-of-Nanoparticle-Tracking-Analysis-on?redirectedFrom=fulltext
dc.identifier.urihttp://hdl.handle.net/2262/91828
dc.descriptionPUBLISHEDen
dc.description.abstractOne of the greatest challenges in the manufacturing and development of nanotechnologies is the requirement for robust, reliable, and accurate characterization data. Presented here are the results of an interlaboratory comparison (ILC) brought about through multiple rounds of engagement with NanoSight Malvern and ten pan-European research facilities. Following refinement of the nanoparticle tracking analysis (NTA) technique, the size and concentration characterization of nanoparticles in liquid suspension was proven to be robust and reproducible for multiple sample types in monomodal, binary, or multimodal mixtures. The limits of measurement were shown to exceed the 30–600 nm range (with all system models), with percentage coefficients of variation (% CV) being calculated as sub 5% for monodisperse samples. Particle size distributions were also improved through the incorporation of the finite track length adjustment (FTLA) algorithm, which most noticeably acts to improve the resolution of multimodal sample mixtures. The addition of a software correction to account for variations between instruments also dramatically increased the accuracy and reproducibility of concentration measurements. When combined, the advances brought about during the interlaboratory comparisons allow for the simultaneous determination of accurate and precise nanoparticle sizing and concentration data in one measurement.en
dc.format.extent041002-1en
dc.format.extent041002-10en
dc.language.isoenen
dc.relation.ispartofseriesJournal of Micro and Nano-Manufacturing;
dc.relation.ispartofseries5;
dc.relation.ispartofseries4;
dc.rightsYen
dc.subjectIterative learning controlen
dc.subjectNanoparticlesen
dc.subjectParticulate matteren
dc.subjectGeometrical size effecten
dc.titleBenchmark of Nanoparticle Tracking Analysis on Measuring Nanoparticle Sizing and Concentrationen
dc.typeJournal Articleen
dc.contributor.sponsorEuropean Union Framework Programme 7 (FP7)en
dc.contributor.sponsorEuropean Union Framework Programme 7 (FP7)en
dc.contributor.sponsorEuropean Union Framework Programme 7 (FP7)en
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/cmaguir9
dc.identifier.rssinternalid176457
dc.identifier.doihttp://dx.doi.org/10.1115/1.4037124
dc.rights.ecaccessrightsopenAccess
dc.contributor.sponsorGrantNumber262943en
dc.contributor.sponsorGrantNumber262163en
dc.contributor.sponsorGrantNumber246479en
dc.subject.TCDThemeNanoscience & Materialsen
dc.subject.TCDTagInstrumentation, Techniques (Physical Scienceen
dc.subject.TCDTagNANOPARTICLESen
dc.subject.TCDTagNanoparticle Tracking Analysisen
dc.subject.TCDTagScientific Instrumentationen
dc.subject.TCDTagbenchmarkingen
dc.identifier.orcid_id0000-0002-2450-5922
dc.status.accessibleNen


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