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Influence of annealing on the bias voltage dependence of tunnelling magnetoresistance in MgO double-barrier magnetic tunnel junctions with CoFeB electrodes

FENG, GEN; VAN DIJKEN, SEBASTIAN; COEY, JOHN MICHAEL DAVID (American Institute of Physics, 2006)

Magnetoresistance of nickel nanocontacts fabricated by different methods

COEY, JOHN MICHAEL DAVID (American Institute of Physics, 2006)

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Point contact Andreev reflection by nanoindentation of polymethyl methacrylate

COEY, JOHN MICHAEL DAVID (American Institute of Physics, 2006)

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Controlled fabrication of nickel perpendicular nanocontacts using focused ion beam milling

COEY, JOHN MICHAEL DAVID (American Institute of Physics, 2006)