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dc.contributor.advisorPethica, John
dc.contributor.authorNorris, Andrew Christopher
dc.date.accessioned2016-12-15T16:53:09Z
dc.date.available2016-12-15T16:53:09Z
dc.date.issued2009
dc.identifier.citationAndrew Christopher Norris, 'Manipulating atoms using scanning probe microscopy', [thesis], Trinity College (Dublin, Ireland). School of Physics, 2009, pp 278
dc.identifier.otherTHESIS 8753
dc.identifier.urihttp://hdl.handle.net/2262/78547
dc.description.abstractManipulating species using Scanning Probe Microscopy (SPM) is an important discipline in the field of bottom-up fabrication, which facilitates nano-mechanics and electron dynamics investigations. Previous low temperature manipulation highlights include the construction of quantum dots, nano-wires and quantum corrals, all of which began in 1989 with Don Eigler’s iconic writing of I-B-M using 35 xenon atoms. Since then, the field has developed, and we now push, pull, hop, excite, desorb, rotate and dissociate molecules, even managing to induce multiple different stages of a chemical reaction. Despite these successes, precise measurement of the forces, energetics, energy loss processes, coupling efficiencies, and the heating dynamics during atom manipulations, has yet to be achieved. To address these issues and advance this field’s range of application to technologically relevant temperatures, i.e. room temperature (RT) and above, thermal energies role as a control parameter during manipulation is investigated. For the first time, controllable, repeatable and atomically precise STM manipulations have been performed at RT and above, and, using a simultaneously nc-AFM/STM operating with sub-angstrom oscillation amplitudes, the vertical component of the forces present are quantified.
dc.format1 volume
dc.language.isoen
dc.publisherTrinity College (Dublin, Ireland). School of Physics
dc.relation.isversionofhttp://stella.catalogue.tcd.ie/iii/encore/record/C__Rb13915537
dc.subjectPhysics, Ph.D.
dc.subjectPh.D. Trinity College Dublin
dc.titleManipulating atoms using scanning probe microscopy
dc.typethesis
dc.type.supercollectionthesis_dissertations
dc.type.supercollectionrefereed_publications
dc.type.qualificationlevelDoctoral
dc.type.qualificationnameDoctor of Philosophy (Ph.D.)
dc.rights.ecaccessrightsopenAccess
dc.format.extentpaginationpp 278
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