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dc.contributor.authorFERREIRA, MAUROen
dc.date.accessioned2014-01-29T10:56:23Z
dc.date.available2014-01-29T10:56:23Z
dc.date.issued2008en
dc.date.submitted2008en
dc.identifier.citationC. G. Rocha, A. Wall, M. S. Ferreira, Electronic properties of nanotube-based sensors: an inverse modeling approach, Europhysics Letters, 82, 2008, 27004-27009en
dc.identifier.otherYen
dc.identifier.urihttp://hdl.handle.net/2262/67948
dc.descriptionPUBLISHEDen
dc.description.abstractNanotube-based sensors depend on significant conductivity changes induced by doping. Predictions of which impurity/nanotube combination provides efficient sensor characteristics are usually made on a case-by-case basis, following the study of how a particular nanotube responds to the presence of a specific doping agent. With a multitude of possible combinations, this so-called forward modeling approach is unable to address questions of general nature, like, for instance, the necessary features the components must have to produce certain physical properties on the device. Questions of this nature call for an inverse modeling scheme in which information about the sensor components can be extracted from the knowledge of a few physical quantities demanded for the device. Here we make use of a mathematically transparent formalism that works in both the forward and the inverse directions. We argue that this method can provide general guidelines on the absorption process and narrow the search for the ideal combination of tube and doping agents required to produce efficient nanoscopic sensors.en
dc.format.extent27004-27009en
dc.language.isoenen
dc.relation.ispartofseriesEurophysics Lettersen
dc.relation.ispartofseries82en
dc.rightsYen
dc.subjectnanotube-based sensorsen
dc.titleElectronic properties of nanotube-based sensors: an inverse modeling approachen
dc.typeJournal Articleen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/ferreirmen
dc.identifier.rssinternalid49419en
dc.identifier.doihttp://dx.doi.org/10.1209/0295-5075/82/27004en
dc.rights.ecaccessrightsOpenAccess
dc.identifier.rssurihttp://www.iop.org/EJ/article/0295-5075/82/2/27004/epl_82_2_27004.pdfen


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