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dc.contributor.authorFOX, DANIELen
dc.contributor.authorFLEISCHER, KARSTENen
dc.contributor.authorSMITH, CHRISTOPHERen
dc.contributor.authorZHANG, HONGZHOUen
dc.contributor.authorMCGILP, JOHNen
dc.contributor.authorSHVETS, IGORen
dc.date.accessioned2013-08-09T11:14:04Z
dc.date.available2013-08-09T11:14:04Z
dc.date.issued2013en
dc.date.submitted2013en
dc.identifier.citationR. Verre, M. Modreanu, O. Ualibek, D. Fox, K. Fleischer, C. Smith, H. Zhang, M. Pemble, J. F. McGilp, and I. V. Shvets, General approach to the analysis of plasmonic structures using spectroscopic ellipsometry, Physical Review B, 87, 23, 2013, 235428-en
dc.identifier.otherYen
dc.identifier.urihttp://hdl.handle.net/2262/66981
dc.descriptionPUBLISHEDen
dc.description.abstractIn this article a route to analyze the full optical response of plasmonic structures is developed. First, the simple case of an anisotropic thin plasmonic layer supported on a transparent substrate is analyzed by introducing a quantity named anisotropic surface excess function (ASEF). The spectral features are analyzed in terms of effective dielectric function, demonstrating a more direct relation with the plasmonic response of the layer. The formalism is then generalized using a transfer matrix method. The formalism developed is supported by experimental evidence obtained by measuring the response of anisotropic nanoparticle arrays grown at a glancing angle. The agreement between theory and experiment is clear, suggesting that SE can be conveniently employed to measure the spectroscopic response of plasmonic structures. It is also demonstrated that the figure of merit of the plasmonic resonance for refractive index sensing can be greatly improved, with optimized measurement configurations, using polarized spectroscopy.en
dc.format.extent235428en
dc.language.isoenen
dc.relation.ispartofseriesPhysical Review Ben
dc.relation.ispartofseries87en
dc.relation.ispartofseries23en
dc.rightsYen
dc.subjectlocalised plasmon resonanceen
dc.subjectspectroscopic ellipsometryen
dc.subjectnanoparticle arraysen
dc.subjectsurface excess functionen
dc.titleGeneral approach to the analysis of plasmonic structures using spectroscopic ellipsometryen
dc.typeJournal Articleen
dc.contributor.sponsorScience Foundation Ireland (SFI)en
dc.contributor.sponsorScience Foundation Ireland (SFI)en
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/fleiscken
dc.identifier.peoplefinderurlhttp://people.tcd.ie/hozhangen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/foxd6en
dc.identifier.peoplefinderurlhttp://people.tcd.ie/chsmithen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/ivchvetsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/jmcgilpen
dc.identifier.rssinternalid87620en
dc.identifier.doihttp://dx.doi.org/10.1103/PhysRevB.87.235428en
dc.rights.ecaccessrightsOpenAccess
dc.contributor.sponsorGrantNumber11/RFP.1/PHY/3047en
dc.contributor.sponsorGrantNumber06/IN.1/I91en
dc.subject.TCDThemeNanoscience & Materialsen
dc.identifier.rssurihttp://prb.aps.org/abstract/PRB/v87/i23/e235428en


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