Quantification of Subsurface Damage in a Brittle Insulating Ceramic by Three-Dimensional Focused Ion Beam Tomography
Citation:
N. Payraudeau, D. McGrouther and K.U. O'Kelly, Quantification of Subsurface Damage in a Brittle Insulating Ceramic by Three-Dimensional Focused Ion Beam Tomography, Microscopy and Microanalysis, 17, 2011, 240-245Download Item:

Abstract:
In this study, we present a fully automated method to investigate and reconstruct the three-dimensional crack structure beneath an indent in a highly insulating material. This work concentrates on issues arising from a long automatic acquisition process, the insulating nature of the specimen, and the introduction of minimal damage to the original cracks resulting from indentation.
Sponsor
Grant Number
European Commission
026019
Science Foundation Ireland (SFI)
Author's Homepage:
http://people.tcd.ie/okellykDescription:
PUBLISHED
Author: O'KELLY, KEVIN
Type of material:
Journal ArticleSeries/Report no:
Microscopy and Microanalysis17
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Full text availableSubject (TCD):
Nanoscience & MaterialsLicences: