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dc.contributor.authorDonegan, Johnen
dc.contributor.authorBradley, Louiseen
dc.date.accessioned2011-01-17T16:58:46Z
dc.date.available2011-01-17T16:58:46Z
dc.date.issued2007en
dc.date.submitted2007en
dc.identifier.citationW.H. Guo,. J. O'Dowd, M. Lynch, A.L. Bradley, J.F. Donegan, and L.P.Barry, Influence of cavity lifetime on high-finesse microcavity two-photon absorption photodetectors, IEEE Photonics Technology Letters, 19, 6, 2007, 432-434en
dc.identifier.otherYen
dc.identifier.urihttp://hdl.handle.net/2262/49309
dc.descriptionPUBLISHEDen
dc.description.abstractFor optical pulse incidence as compared with continuous-wave incidence, the enhancement of two-photon absorption inside a high-finesse planar microcavity is reduced, the pulse inside the cavity and the cavity spectrum are broadened. The analysis shows that for transform-limited pulse incidence, the true pulsewidth and the cavity frequency resolution can be estimated if the cavity lifetime or the cavity bandwidth has been obtained from the reflection or transmission spectrum of the cavity.en
dc.format.extent432-434en
dc.language.isoenen
dc.relation.ispartofseriesIEEE Photonics Technology Lettersen
dc.relation.ispartofseries19en
dc.relation.ispartofseries6en
dc.rightsYen
dc.subjectOpticsen
dc.subjectlight refelctionen
dc.subjectmicro-opticsen
dc.titleInfluence of cavity lifetime on high-finesse microcavity two-photon absorption photodetectorsen
dc.typeJournal Articleen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/jdoneganen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/bradlelen
dc.identifier.rssinternalid50808en
dc.identifier.doihttp://dx.doi.org/10.1109/LPT.2007.892884en
dc.identifier.rssurihttp://ieeexplore.ieee.org/iel5/68/4116754/04130445.pdf?tp=&isnumber=&arnumber=4130445en
dc.identifier.orcid_id0000-0002-5240-1434en


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