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dc.contributor.authorCOLEMAN, JONATHANen
dc.contributor.authorBLAU, WERNERen
dc.contributor.authorBOLAND, JOHNen
dc.date.accessioned2009-07-03T13:40:48Z
dc.date.available2009-07-03T13:40:48Z
dc.date.issued2009en
dc.date.submitted2009en
dc.identifier.citationEvelyn Doherty, Sukanta De, Philip E Lyons, Aleksey Shmeliov, Peter N. Nirmalraj, Vittorio Scardaci, Jerome Joimel, Werner J Blau, John J Boland, Jonathan N Coleman, The spatial uniformity and electromechanical stability of transparent, conductive films of single walled nanotubes, Carbon, 47, 10, 2009, 2466 - 2473en
dc.identifier.otherYen
dc.identifier.urihttp://hdl.handle.net/2262/31246
dc.descriptionPUBLISHEDen
dc.description.abstractWe have prepared thin films of arc discharge single walled nanotubes by vacuum filtration. For film thicknesses greater than 40 nm, the films are of high optical quality; the optical transmission varies by <2% over the film area when measured with a spatial resolution of 4 ?m. However, the films become spatially non-uniform for film thickness below 40 nm. The in-plane DC conductivity correlates with the uniformity, increasing from 3800 S/m for a 10 nm thick film to 2?2.5 ? 105 S/m for films of thickness >40 nm. Conductive atomic force microscopy maps show reasonably uniform current flow out of the plane of the film. For all thicknesses, the optical transmittance scales with film thickness as expected for a thin conducting film with optical conductivity of 1.7 ? 104 S/m (? = 550 nm). For films with t > 40 nm the ratio of DC to optical conductivity was ?DC/?Op = 13.0, leading to values of transmittance and sheet resistance such as T = 80% and Rs = 110 ?/? for the t = 40 nm film. Electromechanically, these films were very stable showing conductivity changes of <5% and <2% when cycled over 2000 times in compression and tension respectively.en
dc.description.sponsorshipScience Foundation Ireland funded collaboration (SFI grant 03/CE3/M406s1) between Trinity College Dublin, University College Cork and Hewlett Packard, Dublin Inkjet Manufacturing Operationen
dc.format.extent2466en
dc.format.extent2473en
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.relation.ispartofseriesCarbonen
dc.relation.ispartofseries47en
dc.relation.ispartofseries10en
dc.rightsYen
dc.subjectPhysicsen
dc.titleThe spatial uniformity and electromechanical stability of transparent, conductive films of single walled nanotubesen
dc.typeJournal Articleen
dc.contributor.sponsorScience Foundation Ireland (SFI)en
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/colemajen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/jbolanden
dc.identifier.peoplefinderurlhttp://people.tcd.ie/wblauen
dc.identifier.rssinternalid59643en
dc.identifier.doihttp://dx.doi.org/10.1016/j.carbon.2009.04.040en
dc.identifier.rssurihttp://dx.doi.org/10.1016/j.carbon.2009.04.040


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