The spatial uniformity and electromechanical stability of transparent, conductive films of single walled nanotubes
Item Type:Journal Article
Citation:Evelyn Doherty, Sukanta De, Philip E Lyons, Aleksey Shmeliov, Peter N. Nirmalraj, Vittorio Scardaci, Jerome Joimel, Werner J Blau, John J Boland, Jonathan N Coleman, The spatial uniformity and electromechanical stability of transparent, conductive films of single walled nanotubes, Carbon, 47, 10, 2009, 2466 - 2473
The spatial uniformity and electromechanical stability of transparent, conductive films of single walled nanotubes.pdf (published (publisher copy) peer-reviewed) 894.1Kb
We have prepared thin films of arc discharge single walled nanotubes by vacuum filtration. For film thicknesses greater than 40 nm, the films are of high optical quality; the optical transmission varies by <2% over the film area when measured with a spatial resolution of 4 ?m. However, the films become spatially non-uniform for film thickness below 40 nm. The in-plane DC conductivity correlates with the uniformity, increasing from 3800 S/m for a 10 nm thick film to 2?2.5 ? 105 S/m for films of thickness >40 nm. Conductive atomic force microscopy maps show reasonably uniform current flow out of the plane of the film. For all thicknesses, the optical transmittance scales with film thickness as expected for a thin conducting film with optical conductivity of 1.7 ? 104 S/m (? = 550 nm). For films with t > 40 nm the ratio of DC to optical conductivity was ?DC/?Op = 13.0, leading to values of transmittance and sheet resistance such as T = 80% and Rs = 110 ?/? for the t = 40 nm film. Electromechanically, these films were very stable showing conductivity changes of <5% and <2% when cycled over 2000 times in compression and tension respectively.
Science Foundation Ireland (SFI)
Type of material:Journal Article
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