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  • Spectroscopical analyis of strained silicon quantum wells 

    PEROVA, TANIA; MOORE, ROBERT; BLAU, WERNER (SPIE, 2005)
    In this study, Strained silicon Quantum Wells (QW) were characterised using a variety of micro-scopical techniques. Among the techniques used were Transmission Electron Microscopy (TEM), Elemental Electron Loss ...