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dc.contributor.authorDONEGAN, JOHN FRANCIS
dc.date.accessioned2008-06-20T10:23:49Z
dc.date.available2008-06-20T10:23:49Z
dc.date.issued2006
dc.date.submitted2006en
dc.identifier.citationW. H. Guo, D. Byrne, Q. Y. Lu, R. Phelan, J. F. Donegan, and B. Corbett. 'Determination of internal loss and quasi-fermi level separation from the amplified spontaneous emission (ASE) spectrum of Fabry-Perot (FP) semiconductor lasers' in Photonics Technology Letters, 18, (18), 2006, pp. 1910 - 1912 .en
dc.identifier.issn50748
dc.identifier.otherY
dc.identifier.urihttp://hdl.handle.net/2262/17461
dc.descriptionPUBLISHEDen
dc.description.abstractThe net modal gain and the un-amplified spontaneous emission (ASE) coupled into the laser waveguide mode are extracted from the ASE spectrum of Fabry?PErot semiconductor lasers by the Fourier transform method with a deconvolution process. Highly accurate quasi-Fermi level separation and internal loss are then derived by a minimum search process from the relationship between the spontaneous emission and gain.en
dc.description.sponsorshipSFIen
dc.format.extent1910en
dc.format.extent1912en
dc.format.extent173171 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherIEEEen
dc.relation.ispartofseries18en
dc.relation.ispartofseries18en
dc.rightsYen
dc.subjectAmplified spontaneous emissionen
dc.subjectFabry?Perot (FP) semiconductor laseren
dc.titleDetermination of internal loss and quasi-fermi level separation from the amplified spontaneous emission (ASE) spectrum of Fabry-Perot (FP) semiconductor lasersen
dc.typeJournal Articleen
dc.contributor.sponsorScience Foundation Ireland
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/jdonegan
dc.identifier.rssurihttp://ieeexplore.ieee.org/iel5/68/35456/01683844.pdf?tp=&isnumber=35456&arnumber=1683844


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