Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier
Item Type:Conference Paper
Citation:Surre, F. and Kennedy, B. and Landais, P. and Philippe, S. and Bradley, A. L. 'Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier', International Conference on Transparent Optical Networks, 18-22 June 2006, 2, 2006, pp. 169-172.
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The anticipated growth in demand for bandwidth leads to the development of all-optical signal processing techniques at ever increasing data rates. One possible candidate to achieve the required performance is the semiconductor optical amplifier (SOA). It has been demonstrated that ultra-fast gain processes are dominant for pulsewidths below 10 ps. In this paper we present experimental results on the polarization dependence of ultra-fast gain dynamics in InGaAsP/InP bulk material SOA probed using a four-wave mixing technique. Using a standard low-pass filter model it is possible to retrieve information on the polarization dependence of linewidth enhancement factors and the timescales for non-linear phenomena such as carrier density pulsation and carrier heating
Type of material:Conference Paper
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